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Prof. Dr. Christina Scheu

Professur für Transmissionselektronenmikroskopie (TEM)

Address Prof. Dr. Christina Scheu
Department Chemie & CeNS
Ludwig-Maximilians-Universität München
Butenandtstr. 11, Haus E
81377 München
Germany
Phone +49 (0)89 2180-77184 / -77621
Fax +49 (0)89 2180-77622
Room E2.001
E-Mail Christina.Scheu@cup.uni-muenchen.de
Internet Webseite
Research interests
  • Structural and chemical analysis of materials with high spatial resolution & correlation to properties
  • Exploring chemistry, bonding and atomic and electronic structure of interfaces & nanostructures
  • Transmission electron microscopy (TEM): high resolution & in-situ TEM methods, electron energy loss spectroscopy (EELS), electron energy-loss near-edge structure (ELNES)
Short CV
  • Since June 2008: Professor at LMU Munich, Department of Chemistry and Biochemistry
  • 2005-2008: Group leader at the Department Metallurgy & Materials Testing, Montanuniversität Leoben, Austria
  • 2003-2005: Group leader at the Materialprüfungsanstalt der Universität Stuttgart
  • 1999-2003: Research assistent at the Max Planck Institute for Metals Research Stuttgart
  • 1996-1998: Guest scientist at the Technion Israel Institute of Technology, Department of Materials Engineering, Haifa, Israel
  • 1993-1996: PhD thesis at the Max Planck Institute for Metals Research, Stuttgart
  • 1986-1993: Study of Physics, Technische Hochschule Darmstadt
Key publications
  • "High Carbon Solubility in a -TiAl-based Ti-45Al-5Nb-0.5C Alloy and its Effect on Hardening", C. Scheu, E. Stergar, M. Schober, L. Cha, H. Clemens, A. Bartels, F.-P. Schimansky, A. Cerezo, Acta Materialia, 57, 2009, 1504-1511.
  • "N-K Electron Energy-Loss Near-Edge Structures for TiN/VN Layers: an ab-Initio and Experimental Study", P. Lazar, J. Redinger, J. Strobl, R. Podloucky, B. Rashkova, G. Dehm, G. Kothleitner, S. Šturm, K. Kutschej, C. Mitterer and C. Scheu, Analytical Bioanalytical Chemistry, 390, 2008, 1447-1453.
  • "Control of Bonding and Epitaxy at Copper/Sapphire Interface", S. H. Oh, C. Scheu, T. Wagner and M. Rühle, Applied Physics Letters, 91, 2007, 141912-1 - 141912-3.